【Product Features】
- High speed, high-precision, high repeatability measurement
- Small size, light weight, and easy to carry
- Adopting spectral interferometry measurement mode, it can work stably for a long time
- Optical non-contact non-destructive measurement, the measurement process will not cause damage to the sample
- The software interface is intuitive, English display，easy to operate, and has anexcellent user experience
- Convenient connection to display for setting measurement parameters and system calibration
【Usage characteristics】
- Handheld design that can be carried around to the production site
- Easy to operate, even newcomers can easily get started
- It can also be easily measured in narrow areas or special shapes of the sample
- Non contact carrier platform can also be optionally equipped for film thickness measurement
| Repetitiveness | 0.1% or 0.2 nm (whichever is greater) |
| Resolution | 0.1nm (minimum digit of measurement result) |
| Number of measurement layers | Single layer |
| Measurement mode | Spectral reflectance method |
| Angle of incidence | 90° |
| Test material | Transparent or semi-transparent film materials |
| Measurement time | <100ms/Point |
| Handheld probe | 20×90mm (standard) / 16×90mm (optional) |
| Optical fiber length | 1.5 meters (standard configuration) / Other lengths (customizable) |
| Measuring the light spot | <200µm |
| Communication interface | USB3.0 |
| Power Supply | AC220V±10%/50Hz±0.1% |
| Host dimensions | 250x 120x 280mm (width x height x depth) |
| Operating System | Windows7/Windows10 |
| Configure a computer | Configure a computer |
