Surface Waviness Tester LANCE®3234

● Using Linux operation system. High calculation accuracy, fast data processing speed and friendly user interface.

● Separated design for easy operation.

● Portable design, easy to carry.

● It can measure surface roughness, waviness and primary profile.

● It has a wide measuring range of 1000μm and maximum tracing length up to 50mm.

● 5.7inch TFT LCD screen to clearly display the evaluation curves.

● With Touch screen to quickly set the measuring conditions on the screen.

● Mouse operation is supported.

● Store 10,000 groups of measuring conditions and data.

● Measurement data can be stored in U disk.

● Measurement with or without skid.

● Print measurement parameters and profile curves.

● Equipped with optional advanced analysis software.

● Conforming to the roughness standards including ISO4287-1997, JIS 0601: 2001; ANSI; SEP1941-2012.

Item	Description
Profile	R, W, P, R-Motif, W-Motif
Measuring parameters	See the Table 1 below
Filter	Gauss, 2RC
Cutoff l	0.08mm, 0.25mm, 0.8mm, 2.5mm, 5mm, 8mm, 10mm
Evaluation length ln	(1-5)l
Measuring range	1000μm（±500μm）
Max. resolution	0.0003μm
Tracing length	50mm
Tolerance	±5%(Skid), ±10%(Skidless)
Repeatability	1.5%(Skid)，3%(Skidless)
Storage	10000 groups of measuring conditions and data
Interface	RS232，USB
Power	Built-in lithium-ion rechargeable batteries / External power adapter
Working temperature	0℃～40℃
Storage temperature	-25℃～60℃
Humidity	<90％
Main unit dimension	260mm×210mm×68mm
Main unit weight	1.5Kg
Driver dimension	195.5mm×60mm×122mm
Driver weight (with portable stand)	1.58Kg
Power adapter	Input: 100 V～240VAC，50/60Hz; Output: 9V，3A

Standard Delivery

Table 1

Standard	Profile Curves	Parameters
ISO1997	R	Ra，Rq，Rz，Rp，Rv，Rsk, Rku, Rc, RPc ^﹡, RSm, R△q, Rmr^﹡, Rmr(c)^﹡, Rδc^﹡, Rt, Rz1max,Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Vo
	P	Pa, Pq, Pz, Pp, Pv, Psk, Pku, Pc, PPc^﹡, PSm, P△q, Pmr^﹡, Pmr(c)^﹡, Pδc^﹡, Pt, Pz1max
	W	Wa, Wq, Wz, Wp, Wv, Wsk, Wku, Wc, WPc¹, WSm, W△q, Wmr^﹡, Wmr(c)^﹡, Wδc^﹡, Wt, Wz1max
JIS2001	R	Ra, Rq, Rz, Rp, Rv, Rsk, Rku, Rc, RSm, RzJIS, R△q, Rmr^﹡, Rmr(c)^﹡, Rδc^﹡, Rt
	P	Pa, Pq, Pz, Pp, Pv, Psk, Pku, Pc, PSm, PzJIS, P△q, Pmr^﹡, Pmr(c)^﹡, Pδc^﹡, Pt
	W	Wa, Wq, Wz, Wp, Wv, Wsk, Wku, Wc, WSm, WzJIS, W△q, Wmr^﹡, Wmr(c)^﹡, Wδc^﹡, Wt
ANSI	R	Ra, Rq, Rz, Rp, Rv, Rsk, Rku, RPc^﹡, RSm, R△a, R△q,Htp^﹡, tp^﹡, Rt, Rmax, Rpm
ANSI	W	Wa, Wq, Wz, Wp, Wv, Wsk, Wku, WPc^﹡, WSm, W△a, W△q,Htp^﹡, tp^﹡, Wt, Wmax, Wpm